Release of New IC Test Handlers by EPSON
Seiko Epson made an announcement on release of new NS-8010 Series of IC test handlers in response to consumers’ demand in reducing testing cost. The new NS-8010 series come with a selection of compact, low price models complementing Epson’s NS-8000 series of high speed, high accuracy IC test handlers. The new series low price was achieved through development of dedicated room temperature test unit.
The new series features a small footprint saving factory floor space with a width of only 1,400mm, taking up 18% less space in comparison to Epson’s previous model. Some of the new series’s specifications are its 2 and 4 parallel test sites, throughput of up to 8,000 units per hour and choice of test temperature of room and high temperature, with 3 classes of tray classification. The shipment of the NS-8010 has commenced as of late November.
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