Release of “ActiveFlow” System offering Industry’s lowest Argon Gas Consumption
SII Nano Technology Inc. (SIINT) has announced the release of “ActiveFlow” system for ICP-OES (Inductively Coupled Plasma – Optical Emission Spectrometer) and ICP-AES (Inductively Coupled Plasma – Atomic Emission Spectrometer). The new SPS3500 series achieves world’s lowest Argon gas consumption. The ICP-OES is capable of measuring the impurity in liquid samples in the order from ppm (parts per million) to ppd (parts per billion) order. This instrument is used in various applications, including metal, ceramic, petrochemicals, medicine, agriculture as well as environment. Read more
Development of Focused Ion Beam System using Nanometer Order Diameter Ion Beam
SII Nano Technology (SIINT) has announced the release of SMI4050 Focused Ion Beam system. Focused Ion Beam system (FIB) is the system that is used for etching, depositing and observation in a single system using the nanometer order diameter ion beam. Through this ability FBI is capable of circuit modification of semiconductor devices, the defective characterization, the cross sectioning and observation, the TEM sample preparation, metal grain observation, and others, contributing in development and improvement of electric components, advanced functional materials such as semiconductor. Read more
