Release of “ActiveFlow” System offering Industry’s lowest Argon Gas Consumption
SII Nano Technology Inc. (SIINT) has announced the release of “ActiveFlow” system for ICP-OES (Inductively Coupled Plasma – Optical Emission Spectrometer) and ICP-AES (Inductively Coupled Plasma – Atomic Emission Spectrometer). The new SPS3500 series achieves world’s lowest Argon gas consumption. The ICP-OES is capable of measuring the impurity in liquid samples in the order from ppm (parts per million) to ppd (parts per billion) order. This instrument is used in various applications, including metal, ceramic, petrochemicals, medicine, agriculture as well as environment. Read more
Development of X-ray Inspection System for Rapid Detection of Electrode Plates in Lithium-Ion Batteries
Seiko Instrument Nano Technology (SIINT) has developed a new X-ray inspection system enabling rapid detection and elemental identification of metal particles of approximately 20 micrometer in diameter found in the electrode plate of fuel cells and lithium ion rechargeable batteries. Detection and identification of such metal particles in electrode materials, separators of fuel cells as well as lithium ion rechargeable batteries is an essential step in preventing overheating and fire in batteries and maintaining a better battery capacity, while ensuring a longer battery life. The new “SEA-Hybrid” X-ray system will automatically enables X-ray imaging, detection of metal particles and elemental analysis. The system will make it so easy; the operator will need to only place the sample such as electrode plates, separators or active materials, in a pan and select the detection procedure, and then start the measurement. Read more
Release of High Performance Fluorescent X-Ray Coating Thickness Gauge
Seiko Instrument Nano Technology (SIINT) has released the SFT9500X Series of high performance fluorescent X-ray coating thickness gauge for micro spot measurement of metal plating and deposition. The measurement and control of coating thickness and decomposition of plated and deposited metallic thin films are used in semiconductors, electronic components and printed circuit boards, a critical process in maintaining functionality, quality and cost. The new SFT9500X Series offers a precise and expedited measurement of micro spots on lead frames, connectors, as well as flexible substrates which is normally not possible with conventional fluorescent X-ray coating thickness gauges due to their lower irradiation intensities. Read more
Development of Focused Ion Beam System using Nanometer Order Diameter Ion Beam
SII Nano Technology (SIINT) has announced the release of SMI4050 Focused Ion Beam system. Focused Ion Beam system (FIB) is the system that is used for etching, depositing and observation in a single system using the nanometer order diameter ion beam. Through this ability FBI is capable of circuit modification of semiconductor devices, the defective characterization, the cross sectioning and observation, the TEM sample preparation, metal grain observation, and others, contributing in development and improvement of electric components, advanced functional materials such as semiconductor. Read more
Development of World’s First X-ray Inspection Systems Capable of High Speed Detection and Automatic Elemental Analysis of Small Contaminant in Li-Ion Batteries
Presence of metal particle contaminants in fuel cells and lithium ion rechargeable batteries are the major contributor to batteries production yield as well as their lifetime. It also causes the batteries to heat up and in worst scenario causes fire. In light of this, it would be of out most importance for the manufacturer of such batteries to detect and avoid the metal particles contaminant due to the large presence of such batteries in electric vehicles, hybrid electric vehicles, as well as in home use. For this reason battery manufacturers as a safety step perform complex failure analysis to detect such metal particles. The contamination is caused by the materials such as active materials, the separators as well as materials from the coating process. The current failure analysis specifies which manufacturing process the batteries are contaminated from, along with identifying the location of metal particles using X-ray CT system or an optical microscope. Finally, the target particles are analyzed using a Scanning Electron Microscope or a fluorescent X-ray analyzer. However, this system fails to detect particles of less than 50um in diameter, plus it takes a long time for detection analysis. Read more
